首页> 外文会议>Conference on Hard X-Ray and Gamma-Ray Detector Physics,Optics,and Applications >Orthogonal strip gamma-ray imaging system for use with HgI2 and Cd1-xZnxTe detectors
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Orthogonal strip gamma-ray imaging system for use with HgI2 and Cd1-xZnxTe detectors

机译:与HGI2和CD1-XZNXTE探测器一起使用的正交条形伽马射线成像系统

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We have designed and constructed an orthogonal strip imaging system for use with room temperature semiconductor strip detectors. The system has been tested with both HgI$-2$/ and Cd$-1-x$/Zn$-x$/Te (CZT) detector elements. Our first system consists of complete readout electronics and software for spectroscopy and imaging with 8 by 8 orthogonal strip detectors. The readout electronics consist of 16 channels of hybrid charge sensitive preamplifiers, and 16 channels of parallel discriminators, shaping amplifiers, and a 16 channel ADC implemented in CAMAC and NIM. The software used to readout the instrument is capable of performing intensity measurements as well as spectroscopy on all 64 pixels of the device. In this paper we describe measurements to determine the factors limiting the performance of this system.
机译:我们设计并构建了一个正交的带状成像系统,用于与室温半导体条带探测器一起使用。该系统已通过HGI $ -2 $ /和CD $ -1-x $ / zn $ -x $ / te(czt)探测器元素进行测试。我们的第一个系统由完整的读数电子和软件组成,用于光谱学和8乘8乘8个正交的带探测器。读出电子器件由16个混合电荷敏感前置放大器和16个平行鉴别器,成形放大器和16个通道ADC以CAMAC和NIM实现的16个通道组成。用于读出仪器的软件能够在设备的所有64个像素上执行强度测量以及光谱。在本文中,我们描述了测量以确定限制该系统性能的因素。

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