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128x128-element silicon microlens array fabricated by ion-beam etching for PtSi IRCCD

机译:128x128元素微透镜阵列,由离子束蚀刻制造,用于PTSI IRCCD

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A silicon refractive microlens array mounted on a 128- $MUL 128-element PtSi IR CCD focal-plane architecture is fabricated using a multiple-process, including photolithography, heat treatment, and argon ion beam etching techniques. The optical filling factor of PtSi IR CCD with refractive microlens array is more than 95 percent. The focal length of the square-base arch silicon microlens is about 90 micrometer. Both the scanning electron microscope and the surface style measurement are carried out to determine the dimensions and the surface morphology of silicon refractive microlens. The matching properties between the preshaped photoresist mask and silicon substrate during argon ion beam etching are given. The techniques utilized can be applied to fabricate microtips array and microplateforms (circle microtips) array.
机译:使用多工艺制造安装在128-$ MUL 128元件PTSI IR CCD焦面型架构上的硅折射微透镜阵列,包括光刻,热处理和氩离子束蚀刻技术。具有折射微透镜阵列的PTSI IR CCD的光学灌装系数大于95%。方形拱形硅片微透镜的焦距约为90微米。扫描电子显微镜和表面样式测量都进行以确定硅折射微透镜的尺寸和表面形态。给出了在氩离子束蚀刻期间预分级的光致抗蚀剂掩模和硅衬底之间的匹配性质。所使用的技术可以应用于制造微调阵列和微孔板(圆微小块)阵列。

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