首页> 外文会议>ASME International Mechanical Engineering Congress and Exposition >A STUDY OF THE EFFECT OF EXTENDED HOUNSFIELD UNIT RANGE AND VOXEL SIZE ON DEFECT DETECTION IN FRICTION STIR WELDS
【24h】

A STUDY OF THE EFFECT OF EXTENDED HOUNSFIELD UNIT RANGE AND VOXEL SIZE ON DEFECT DETECTION IN FRICTION STIR WELDS

机译:扩展Hounsfield单位范围和体素尺寸对摩擦搅拌焊缝缺陷检测的影响研究

获取原文

摘要

Friction stir welding (FSW) is a novel we/ding method that is garnering attention, in part, due to its ability to join dissimilar materials. One of the challenges in producing dissimilar friction welded joints is ensuring the welds are defect-free. Nondestructive testing (NDT) methods such as ultrasonic waves, gamma rays, X-rays, and X-ray CT, are gaining popularity as a method to detect internal defects in FSW joints. In this study, dissimilar AA 1050-AA6061-T6 FSW lap welds are Manufactured and then examined using an NDT X-ray CT technique. The effects of two critical X-ray CT scanning parameters (voxel size and Hounsfield unit (HU)) on the detection of internal defects are investigated. The samples are scanned via X-ray CT at two different voxel sizes (2.457 E-02 and 1.420 E-03 mm~3) and two HU ranges (12-bit and 16-bit depth). The generated Digital Imaging and Communications in Medicine (DICOM) images are segmented based on a proper HU threshold found via the Otsu thresholding method. The findings show that Small voxel size (higher resolution) improves the ability of detecting internal defects and improves the effectiveness of the thresholding process. Higher HU range results in a wider separation between detected material peaks, thus enhancing the effectiveness of the thresholding process as well.
机译:摩擦搅拌焊接(FSW)是一种新的我们/丁方法,部分是由于其加入不同材料的能力而富有奖金。产生不同摩擦焊接接头的挑战之一是确保焊缝是无缺陷的。非破坏性测试(NDT)诸如超声波,伽马射线,X射线和X射线CT的方法,其普及作为检测FSW关节中的内部缺陷的方法。在该研究中,制造不同的AA 1050-AA6061-T6 FSW搭接焊缝,然后使用NDT X射线CT技术检查。研究了两个关键X射线CT扫描参数(体素尺寸和Hounsfield单元(Hu))对内部缺陷检测的影响。将样品通过X射线CT扫描两种不同的体素尺寸(2.457 e-02和1.420 e-03mm〜3)和两个Hu范围(12位和16位深度)。基于通过OTSU阈值方法发现的适当的HU阈值,生成的数字成像和医学中的通信(DICOM)图像被分割。调查结果表明,小型体素尺寸(较高分辨率)提高了检测内部缺陷的能力并提高了阈值处理的有效性。较高的HU范围导致检测到的材料峰之间更宽的分离,从而增强了阈值处理的有效性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号