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3-D topography simulation of via holes using generalized solid modeling

机译:三维地形仿真通过广义实体建模的通孔模拟

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A 3-D deposition and etching simulator using "generalized solid modeling (GSM) method" has been developed. This simulator uses the boundary representation model to define solids, forming the individual materials of the wafer. Then, basic solid modeling operations are used to deform the solids without the need for complex loop removal algorithms. In this simulator, the "3-D unified equation," whose parameters are the same as those of the 2-D equation, is used to calculate a local deposition and/or etching rate. To precisely calculate the movement vector of each vertex for complex 3-D structures, the "3-D plane model" and "semi-sphere mesh method" have been developed. This simulator has been applied to the patterning and metallization of via holes, and its results closely agree with experimental results.
机译:已经开发了使用“广义实体建模(GSM)方法”的3-D沉积和蚀刻模拟器。该模拟器使用边界表示模型来定义固体,形成晶片的各个材料。然后,基本的实体建模操作用于使固体变形而无需复杂的环路算法。在该模拟器中,使用与2-D等式相同的“三维统一方程”,其参数与二方程的相同,用于计算本地沉积和/或蚀刻速率。为了精确地计算用于复杂的3-D结构的每个顶点的移动向量,已经开发了“三维平面模型”和“半球形网格方法”。该模拟器已应用于Via孔的图案化和金属化,其结果与实验结果非常符合。

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