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A novel stochastic resolution criterion for fluorescence microscopes

机译:用于荧光显微镜的新型随机分辨率标准

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Rayleigh's criterion is widely in optical microscopy to determine the resolution of microscopes. Despite its widespread use, it is well known that this criterion is heuristic and does not consider the actual measurement process. For instance, it has been pointed out that the resolution of a fluorescence microscope can, in principle, exceed Rayleigh's criterion when distance determination between two point sources is postulated as a parameter estimation problem. In fact, recent results from single molecule fluorescence experiments show that the location of two closely spaced point sources with distance of separation well below Rayleigh's criterion can be accurately estimated. These results suggest that Rayleigh's criterion is inadequate for current microscope techniques. Here, by adopting an information-theoretic stochastic framework, we re-visit the resolution problem and derive a new stochastic resolution criterion that provides a limit to the accuracy with which the distance between two point sources can be determined. Our results predict that the distance between two point sources can be determined to an arbitrary accuracy provided a sufficient number of photons are detected. The new criterion is given in terms of quantities such as the expected number of detected photons, the numerical aperture of the objective lens and the wavelength of the detected photons. We also investigate how the new resolution measure is influenced by deteriorating experimental factors such as pixelation of the detector and additive noise sources.
机译:Rayleigh的标准在光学显微镜中广泛地是测定显微镜的分辨率。尽管使用广泛使用,但众所周知,该标准是启发式的,并且不考虑实际的测量过程。例如,已经指出,当两个点源之间的距离确定被假定为参数估计问题时,荧光显微镜的分辨率可以超过Rayleigh的标准。实际上,单分子荧光实验的最近结果表明,可以精确地估计两个紧密间隔的点距离,距离瑞利的距离低于Rayleigh的标准。这些结果表明Rayleigh的标准对于当前的显微镜技术不充分。这里,通过采用信息理论随机框架,我们重新访问分辨率问题并得出了新的随机分辨率标准,其提供了可以确定两个点源之间距离的准确性的限制。我们的结果预测,提供了两个点源之间的距离可以被确定为任意精度,所以提供了足够数量的光子。根据诸如预期的检测到的光子的数量,物镜的数值孔径和检测到的光子的波长的数量给出了新标准。我们还研究了如何通过降低检测器和添加剂噪声源等实验因素来影响新分辨率测量的影响。

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