An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability

摘要

100-Gb/s optical interconnection devices are expected to be deployed widely in large scale datacenters in the near future. As it is required to setup these large scale datacenters in a short period, 100-Gb/s devices need to have shorter time-to-market. We have developed a test system which is capable of testing 16-lanes of 28-Gb/s both optical and electrical interfaces simultaneously. This multiple lane configuration provides a more realistic operating environment to the device under test in order to confirm inter-lane interference or power integrity. The test system also includes repeatable optical connectors which has variation of insertion loss less than +/- 0.3dB after more than 100,000 repeated plug/unplug operations. This test solution can be applied to high speed optical interconnection device testing in high volume manufacturing.