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A simplified Approach for DAC with Phased-Array

机译:使用相控阵的DAC简化方法

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摘要

Sizing with phased-array techniques and DAC method is very time consuming in the preparation phase, because one has to record a DAC curve for every refraction angle to be realized. The use of a new UT probe technology (trueDGS) now allows to calculate mathematically DAC-curves for all angles. Thus, it is sufficient to record echoes for just one refraction angle as a reference. Furthermore, sound attenuation can be derived from these recorded echoes. After recording one single DAC-curve, curves for all other angles are calculated, while taking different probe parameters for every angle, such as delay line and near-field length and gain difference, into account. With this approach the complexity of flaw sizing with phased-array technology using the DAC-method can be almost reduced to the complexity seen with conventional, single element probes; the set-up time for the DAC-method can be significantly shortened.
机译:通过相位阵列技术和DAC方法尺寸在准备阶段非常耗时,因为一个人必须为每个折射角记录DAC曲线。使用新的UT探测技术(TRUEDGS)现在允许为所有角度计算数学上的DAC曲线。因此,仅作为参考的仅折射角记录回波足够。此外,声音衰减可以从这些记录的回波派生。在记录一个单个DAC曲线之后,计算所有其他角度的曲线,同时为每个角度进行不同的探针参数,例如延迟线和近场长度和增益差。通过这种方法,使用DAC-Metife采用分阶段阵列技术的缺陷尺寸的复杂性可以几乎减少到用常规单元素探头看到的复杂性; DAC方法的设置时间可以显着缩短。

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