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An Optimal Lower Bound for Monotonicity Testing over Hypergrids

机译:对HyperGrids的单调性测试的最佳下限

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For positive integers n, d, consider the hypergrid [n]~d with the coordinate-wise product partial ordering denoted by γ. A function f : [n]~d → N is monotone if {arbitrary}_x γ y, f(x) ≤ f(y). A function f is ε-far from monotone if at least an ε-fraction of values must be changed to make f monotone. Given a parameter ε, a monotonicity tester must distinguish with high probability a monotone function from one that is ε-far. We prove that any (adaptive, two-sided) monotonicity tester for functions f: [n]~d → N must make Ω(ε~(-1) d log n-ε~(-1) log ε~(-1)) queries. Recent upper bounds show the existence of O(ε~(-1) d log n) query monotonicity testers for hypergrids. This closes the question of monotonicity testing for hypergrids over arbitrary ranges. The previous best lower bound for general hypergrids was a non-adaptive bound of Ω(d log n).
机译:对于正整数N,D,考虑使用由γ表示的坐标式产品部分排序的超鳃和D。如果{任意} _xγy,f(x)≤f(y),则函数f:[n]〜d→n是单调的。如果必须更改至少一个值的值以使F单调更换,则函数F是远离单调的ε-远离单调。给定参数ε,单调性测试仪必须以高概率与ε-远的单调功能区分。我们证明了任何(自适应,双面)单调测试仪f:[n]〜d→n必须使ω(ε〜(-1)d log n-ε〜(-1)logε〜(-1 ))查询。最近的上限显示了HimpRIDS的查询单调测试仪的O(ε〜(-1)d log n)。这缩短了任意范围内超射线的单调性测试问题。一般超格栅的先前最佳下限是ω(d log n)的非自适应界限。

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