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Balanced Detection to Reduce Noise in a Supercontinuum Light Source for Applications in Broadband Interferometry

机译:平衡检测以降低超高度光源中的噪声,以便在宽带干涉测量中的应用

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摘要

Probing the optical properties of single nanostructures is becoming increasingly important in the context of nanoscience. The optical properties of nanostructures frequently occur over a range of wavelengths, and vary depending on medium and size. The spread of optical information over several wavelengths suggests that charac-terisation of nanostructures should be possible. However the optical properties of small particles are intrinsically difficult to investigate due to their small absorption and scattering cross section. Interferometry is a detection strategy that enables the detection of small particles with an excellent signal to noise ratio. In this approach the weak optical signal from the nano-structure is amplified through interference with a much stronger optical reference. Currently most of these interferometric approaches rely on using single, or a few, discrete wavelengths giving only limited optical information on the nano-structure of interest. Instead using a high power supercontinuum light source, could potentially determine the optical features and properties of the nanostructure over the full visible - NIR wavelength range (here: 450nm - 2μm).
机译:探测单纳米结构的光学性质在纳米科学的背景下变得越来越重要。纳米结构的光学性质经常发生在一系列波长范围内,并根据培养基和尺寸而变化。光学信息在几个波长上的传播表明,应该可以进行纳米结构的Charac-Tenation。然而,由于它们的小吸收和散射横截面,小颗粒的光学性质本质上难以研究。干涉测量是一种检测策略,其能够检测具有出色的信噪比的小颗粒。在这种方法中,通过干扰具有更强的光学参考,通过干扰放大来自纳米结构的弱光学信号。目前大多数这些干涉测量方法依赖于使用单个或几个离散波长,其仅在纳米结构上仅提供有限的光学信息。相反,使用高功率超连续光源,可能在完全可见光波长范围内(这里:450nm - 2μm)潜在地确定纳米结构的光学特征和性质。

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