Exploration of the origin of random error in spectrum intensity measured with THz-TDS

摘要

We explored an origin of the random error in intensity spectra measured with THz-TDS. The optical-delay scanning, variations in temperature and humidity, the intensity fluctuation of fs-laser, and the THz detectors of LT-GaAs PC antenna and ZnTe EO-crystal are not the predominant origin of the random error.