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New UV-Enhanced, Ultra-Low Noise Silicon Avalanche Photodiode for Radiation Detection and Medical Imaging

机译:用于辐射检测和医学成像的新型UV增强,超低噪声硅雪崩光电二极管

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New fast, ultra low-noise UV-enhanced avalanche photodiodes (APD) were recently developed by Excelitas Technologies (formerly PerkinElmer Optoelectronics, Vaudreuil, QC, Canada). for use with scintillation crystals. The novel epitaxial type "buried junction" APD structure was designed for detecting photons with wavelengths shorter than ~600 nm at high gain with very low dark current. It typically exhibits extremely low noise level (<0.1 pA/{the square root of}(Hz) per mm~2) up to multiplication gains of 200-300. The photodetecting performance of the UV-enhanced APDs with scintillators of potential interest in the fields of high-energy physics and medical imaging is presented. Energy resolution under 8% at 662 keV and subnanosecond timing resolution for annihilation radiation can be reached with LGSO 90%Lu (45 ns).
机译:Excelitas Technologies最近开发了新的快速,超低噪声UV-Enhanced Avalanche Photodiodes(APD)(原来的PerkinElmer Optoelectronics,Vaudreuil,QC,Canada)。用于闪烁晶体。设计新的外延类型“掩埋结”APD结构用于检测波长短于〜600nm的光子,高增益具有非常低的暗电流。它通常表现出极低的噪声水平(<0.1Pa / {}(Hz)/ mm〜2的平方根),直至200-300的乘法增益。提出了UV增强APDS与高能物理学和医学成像领域潜在兴趣的闪烁器的光探测性能。在662keV和亚纳癸磺的能量分辨率下8%以下的湮灭辐射时序分辨率可与LGSO 90%Lu(45ns)达到。

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