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How can we minimize errors in a linear-optics quantum gate?

机译:我们如何最小化线性光学量子门中的错误?

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Possible error sources in an experimentally realized linear-optics controlled-Z gate are analyzed by considering the deviations of the beam splitting ratios from the ideal values (δR_H, δR_V), the polarization-dependent phase shift (birefringence) of the optical components (δΦ), and the mode mismatch of input photons (δξ). It is found that the error rate is linearly dependent on δR_V and δξ, while the dependence onδR_H and δΦ is approximately quadratic. As a practical result, the gate is much more sensitive to small errors in R_V than in R_H. Specifically, the reflectivity error for vertical polarization must be less than 0.1% to realize a gate with an error of less than 0.1%, whereas the reflectivity error for horizontal polarization can be up to 1%. The method of analysis used illustrates the basic features of errors in general linear optics quantum gates and circuits, and can easily be adapted to any other device of this type.
机译:通过考虑光束分割比从理想值(ΔR_H,ΔR_V),光学组件的偏振相关相移(双折射)的偏差来分析实验实现的线性光学控制-Z门中的可能误差源(Δφ )和输入光子(ΔΣ)的模式不匹配。发现误差率是线性地取决于ΔR_V和ΔΣ,而对ΔR_H和Δφ的依赖性大致二次。作为实际结果,栅极对R_V的小错误比在R_H中更敏感。具体地,垂直极化的反射率误差必须小于0.1%,以实现误差小于0.1%的栅极,而水平极化的反射率误差可以高达1%。用于分析方法使用的方法示出了一般线性光学量子栅极和电路中的误差的基本特征,并且可以容易地适应这种类型的任何其他装置。

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