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2D arrays and Volume Focusing Combined Inspection Technique.

机译:2D阵列和卷聚焦组合检测技术。

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2D arrays, also called matrix arrays, have recently appeared on the market providing key advantages to improve inspection methods and results. In particular, point focus ability, tilt andskew angle scanning are both promising features that new electronic equipment makers are promoting. Volume Focusing, when used with 2D arrays, yields high inspection speeds,interaction of UT waves and flaws, and the ability to image an entire volume of material without moving the probe. This paper presents such a situation, with results based on using a few 2D Phased arrays, as well as different test pieces to prove the feasibility. Detection as well as resolution abilities, in addition to speed issues are discussed to present not only qualitative, butquantitative data.
机译:2D阵列,也称为Matrix阵列,最近出现在市场上提供了改善检查方法和结果的关键优势。特别是,点聚焦能力,倾斜和剧烈的角度扫描都具有新的电子设备制造商推广的有希望的功能。音量聚焦,与2D阵列一起使用时,产生高的检查速度,UT波和缺陷的相互作用,以及在不移动探针的情况下图像图像的能力。本文提出了这种情况,基于使用几个2D相位阵列的结果,以及不同的测试件以证明可行性。除了速度问题之外,还讨论了检测以及分辨率的能力,以呈现不仅定性,但是的速度问题。

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