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The Application of White Light Interferometry in the Graphic Arts

机译:白光干涉测量在图形艺术中的应用

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White light interferometry is a non-contact technique for the characterization of surface topography. As it is a non-contact and non-destructive method it can be used for all types of materials (solids, liquids, rubbery, sticky, etc.). The instrument is based on the light interference principle. The light from the single source passes through the beam splitter and is directed to the sample surface and the reference mirror. The beams of reflected light from those two surfaces recombine and form the pattern of interference “fringes”. The maximum fringe contrast for each point of the sample occurs when the surface is at the best focus. During the vertical scanning the light interference signal from each point of the sample is recorded by the computer. The fringe signal is demodulated by the appropriate advanced computer algorithms and translated into the information about the surface topography of the sample. The instrument and software (Wyko NT1100 Optical Profiler, by Veeco, USA) allow for quick and accurate characterization of surfaces. Among the surface characterization options and parameters that can be obtained are the surface topography – 2D and 3D images, virtual cross-sections, surface roughness, surface area, volume, line width, step height and much more. The instrument is well suited to be used for R&D as well as problem solving in the Graphic Arts Industry. For example, surface topography determines a number of important properties such as print quality, print density, gloss and visual appearance. The optical profilometry provides a unique view which can quickly resolve surface contributions to print performance. Several examples of surface characterization of the model systems and real samples will be presented in this paper.
机译:白色光干涉测量是用于表征表面形貌的非接触技术。由于它是一种非接触和非破坏性方法,可用于所有类型的材料(固体,液体,橡胶,粘性等)。仪器基于光干扰原理。来自单个源的光通过分束器,并指向样品表面和参考镜子。来自那些两个表面的反射光的光束重组并形成干扰的图案“FRINES”。当表面处于最佳焦点时,样本的每个点的最大边缘对比度会发生。在垂直扫描中,通过计算机记录来自样本的每个点的光干扰信号。边缘信号由适当的高级计算机算法解调并转换为关于样本的表面形貌的信息。仪器和软件(Wyko NT1100光学分析器,由Veeco,USA)允许快速准确地表征表面。在可以获得的表面表征选项和参数中是表面形貌 - 2D和3D图像,虚拟横截面,表面粗糙度,表面积,体积,线宽,阶梯高度等等。该仪器非常适合用于研发以及在图形艺术行业中解决问题。例如,表面形貌确定了许多重要属性,如打印质量,打印密度,光泽和视觉外观。光学轮廓测定法提供了独特的视图,可以快速解决曲面贡献以打印性能。本文将介绍模型系统和真实样品的表面特征的几个例子。

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