首页> 外文会议>Mori Seiki International Conference on Die Mould Technology >Study on Several Key Techniques on 3D Digital Non-touched Measurement
【24h】

Study on Several Key Techniques on 3D Digital Non-touched Measurement

机译:3D数字无触摸测量几种关键技术研究

获取原文

摘要

This paper discusses several key techniques on 3D digital non-touched measurement. These techniques include designing measurement light source, obtaining instantaneous normal direction, following the tracks of normal direction with non-touched measuring probe, overcoming unmeasuring areas, eliminating material influence and mirror face reflection, increasing measurement precision, etc.
机译:本文讨论了3D数字无触摸测量的几个关键技术。这些技术包括设计测量光源,以非触摸测量探头的正常方向的轨道,克服未触及的区域,消除材料影响和镜面反射,增加测量精度等,从而实现瞬时正常方向。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号