Online Determination of Wear Using X-ray Fluorescence Spectroscopy

摘要

According to new developments in the field of X-ray fluorescence spectroscopy (XFS) the wear of processing devices (e. g. plastics processing machines) can be determined. This method allows the determination of the time-dependent development of wear processes. The main advantages of XFS are the broad detection range and the simultaneous detection of different elements. Up to now the analysis of wear is mainly done by means of gravimetric methods. These methods have the disadvantage of slow evaluation and low precision when low abrasive media are used. The disadvantages can be overcome by XFS methods. Some detailed results from studies of wear processes are shown and discussed.