首页> 外文会议>Proceedings of the International Symposium on State-of-the-Art-Program on Compound Semiconductors >Fabrication of Indium-doped n-Fe_2O_3 Thin Films by Spray Pyrolytic Deposition Method for Photoelectrochemical Water Splitting
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Fabrication of Indium-doped n-Fe_2O_3 Thin Films by Spray Pyrolytic Deposition Method for Photoelectrochemical Water Splitting

机译:用喷雾热解沉积法制造铟掺杂的N-Fe_2O_3薄膜光解沉积方法,用于光电子化学水分裂

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Stable indium-doped n-Fe2O_3 thin films were fabricated using a spray pyrolytic deposition (SPD) method on conducting indium-doped, tin oxide coated, glass substrates. The highest photocurrent density of 3.61 mA/cm~2 was observed at +0.3 V vs. SCE for indium-doped n-Fe2Oj samples prepared at an optimum substrate temperature of 688 K. The corresponding highest photoconversion efficiency of 3.73 % was found for the SPD samples prepared using optimum spray time of 60 seconds. X-ray diffraction (XRD) results showed mixed structures (a-Fe_2O_3 and InFeO3). A bandgap energy of 2.2 eV was found from UV-Vis absorption data, which was found to be closer to the indirect bandgap of 2.1 eV obtained from photocurrent densities obtained under monochromatic light illumination. Both of these bandgaps are in agreement with the known bandgap of Fe2O_3. XRD and XPS data confirm the presence of indium dopant on the surface of the thin films in the form of indium(m) iron (ill) oxide (InFeO_3) confirming the successful synthesis of indium-doped n-Fe2O_3.
机译:使用喷射热解沉积(SPD)方法在传导铟掺杂,氧化锡涂覆的玻璃基板上制造稳定的铟掺杂的N-Fe2O_3薄膜。在最佳底物温度为688k的铟掺杂的N-Fe2OJ样品中,观察到3.61mA / cm〜2的最高光电流密度。在688k的最佳底物温度下制备的铟掺杂的N-Fe2Oj样品。对应的最高光电率为3.73% SPD样品使用60秒的最佳喷雾时间制备。 X射线衍射(XRD)结果显示混合结构(A-FE_2O_3和INFEO3)。从UV-Vis吸收数据中发现了2.2eV的带隙能量,发现从在单色光照射下获得的光电流密度获得的2.1eV的间接带隙更接近。这两个带隙都与FE2O_3的已知带隙一致。 XRD和XPS数据确认了铟(M)铁(IM)铁(INFEO_3)形式的薄膜表面上存在铟掺杂剂(INFEO_3),证实了铟掺杂N-Fe2O_3的成功合成。

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