The Metrological Characterization And Optimization Of A Low Cost Measurement System For Inductance Tomography On Conductive Materials

摘要

The paper proposes the improvement and the metrological characterization of a measurement system for non-destructive testing on conductive materials. The limits showed by the previous realized prototype are discussed and overcome using a new hardware and software solution. The metrological characterization in terms of probe linearity, measurement uncertainty, and crack detection sensibility is reported. The experimental analysis carried out using the proposed system on specimens with known defects shows a good agreement between the estimated and expected results.