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A System For The Characterization Of The Micro-Controllers

机译:一种用于表征微控制器的系统

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摘要

The characterization of complex electronic devices is very important for technical as well as didactic reasons. The characterization of the micro-controllers involves the investigation on its peripheral devices, mainly the ADCs, the PWMs, the timer signals, sometimes the DACs. A testing platform has been realised, with reference to the ST52X430 micro-controller. Moreover, it has been improved in order to test the peripheral devices of the ST52X440 micro-controller. It consists of a board and some programmable instruments connected to a PC, on which the implemented software can run. The user can choice the test to be performed on the basis of the IEEE standard 1241-2001. Some results of the ADC characterization made by using this platform have been presented last year. In this work the use of the realised system for the characterization of the other peripheral devices is presented.
机译:复杂电子设备的表征对于技术以及教学原因非常重要。微控制器的表征涉及对其外围设备的研究,主要是ADC,PWMS,定时器信号有时是DAC。已经实现了测试平台,参考ST52X430微控制器。此外,已经改进了测试ST52X440微控制器的外围设备。它由一个板和一些连接到PC的可编程仪器组成,所以可以在其中运行实现的软件。用户可以根据IEEE标准1241-2001选择要执行的测试。去年介绍了使用该平台制作的ADC表征的一些结果。在这项工作中,提出了使用实现的系统来表征其他外围设备。

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