Computer Simulated He I Stark Broadened Line Profiles for Plasma Diagnostics

摘要

The analysis of Stark broadened spectral line profiles in a plasma is one of the most useful techniques for plasma diagnostics specially for the determination of the electron density and temperature in the range for electron densities between 1019 and 1025 m~(-3) and temperatures between lOOO and 300000 K [1]. This diagnostics are carried out, usually, comparing the experimental Measurements with tabulated results of confirmed theoretical models [2,3].