Semiconductor laser longitudinal mode structure study by high-resolution spectroscopy

摘要

For the study of the longitudinal mode structure of semiconductor lasers, a diagnostic method is needed in which the spectral resolution is many times better than the distance between the adjacent longitudinal modes. A diagnostic method based on the high-resolution spectroscopy, the lock-in detection technique and a specially designed software package has been developed. The measured spectra of a semiconductor laser show that the method describes the spectrum with sufficient spectral and signal resolutions.