Modern surface analysis techniques including Auger Electron Spectroscopy (AES), Electron Spectroscopy for chemical Analysis (ESCA, also known as XPS), Secondary Ion Mass Spectrometry (SIMS), Scanning Auger Microscopy (SAM), Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) will be reviewed and discussed in terms of its strength and weakness. The potential of the surface analysis in the failure mode analysis and new products development in the surface finishing for connector industries will be demonstrated using various case studies. Also a comparison of the aforementioned techniques to the traditional failure mode analysis methods such as Scanning Electron Microscopy (SEM), SEM with energy dispersive spectrometer (EDS) will also be made.
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