Stress Analysis of Electronic Connectors by Photoelasticity

摘要

The present paper deals with both the bending stress distribution and the contact stresses of a terminal during the insertion of a pin. Comparing the experimental and reconstructed fringe patterns, the Hertz contact theory was considered to overestimate the contact stresses. After modifying the Hertz contact theory by varying the contact half-length, the reconstructed fringe pattern was perfectly matched to the experimentally obtained fringe pattern. In addition, the location of largest stress for the insertion of various widths of pin was found to be the same.