RESIDUAL STRESS DETERMINATION BY WHOLE PATTERN ANALYSIS - APPLICATION TO SYNCHROTRON HIGH ENERGY XRD MEASUREMENTS ON THERMAL SPRAYED COATINGS

摘要

Synchrotron white beam High Energy X-Ray Diffraction (HEXRD) has tremendous potential for filling the gap between conventional X-ray and neutron diffraction with respect to the depth from which strain information is retrieved. For accessing the wealth of information in multi-peak diffraction patterns a whole-pattern approach is chosen in which all the relevant information is included in the data analysis procedure in order to refine the stress tensor. The refinement process is characterized by the assignment of individual hkl- and orientation dependent diffraction elastic constants and simultaneous refinement of diffraction patterns from different orientations.