STRESS ANALYSIS AND MICROBEAM X-RAY DIFFRACTION STUDY BY USE OF SYNCHROTRON RADIATION SOURCE

摘要

This paper introduces some recent trend of x-ray (residual) stress and microbeam x-ray diffraction analyzes by the use of a synchrotron radiation source (SR) in Japan. In the field of x-ray stress measurement, stresses in several kinds of hkl diffraction could be measured by changing the wavelength of x-rays and a distribution of residual stress near surface could be measured. Since microbeam diffraction profiles with high positional resolution could be obtained by the use of a SR, stress intensity factor range ΔK could be qualitatively estimated from the change in profiles on the fatigue fracture surface and its vicinity. Such results were accomplished by the use of a SR.