Towards a standard for embedded core test: an example

摘要

Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability withrespect to the test of such core-based ICs, especially if they contain cores from different sources. This paper briefly describes IEEE P1500, and illustrates through a simplified example its dual compliance concept, its Scalable Hardware Architecture, and its Core Test Language. Note that this paper provides a preliminary, unapproved view on IEEE P1500. The standard is still under development, and this paper only reflects the view of five active participants of the standardization committee on its currentstatus.