Radiation hardening of power MOSFETs using electrical stress

机译：使用电力应力辐射电力MOSFET的硬化

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Application of high voltage electrical stresses to NVDMOSFET-type COTS transistors was explored as an original hardening option. Such pre-irradiation treatment enhances transistor response to total dose.

机译：将高压电应力应用于NVDMOSFET型CITS晶体管作为原始硬化选项。这种预照射处理可增强晶体管对总剂量的反应。

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《European Conference on Radiation and its Effects on Components and Systems》|1999年||共6页
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C. Picard; C. Brisset; O. Quittard; A. Hoffmann; F. Joffre; J- P. Charles;
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专利

1. Radiation hardening of power MOSFETs using electrical stress [J] . Picard C., Brisset C. IEEE Transactions on Nuclear Science . 2000,第3期

机译：利用电应力对功率MOSFET进行辐射硬化
2. Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET [J] . K. Niskanen, A. D. Touboul, R. Coq Germanicus, IEEE Transactions on Nuclear Science . 2020,第7期

机译：电力应力和中子辐射对碳化硅功率MOSFET可靠性的影响
3. THE COMPARISON OF GAMMA-RADIATION AND ELECTRICAL STRESS INFLUENCES ON OXIDE AND INTERFACE DEFECTS IN POWER VDMOSFET [J] . Djoric-Veljkovic Snezana M., Manic Ivica Dj., Davidovic Vojkan S., Nuclear technology & radiation protection . 2013,第4期

机译：功率VDMOSFET的γ射线辐射和电应力对氧化物和界面缺陷的影响比较
4. Radiation hardening of power MOSFETs using electrical stress [C] . Picard, C., Brisset, . 2000

机译：利用电应力对功率MOSFET进行辐射硬化
5. Modeling of the impact of electrical stressors on the degradation process of power mosfets [D] . Mahiuddin, Shompa S. 2011

机译：电应力源对功率MOSFET降解过程影响的建模
6. Stress Induced Mechano-electrical Writing-Reading of Polymer Film Powered by Contact Electrification Mechanism [O] . Sumita Goswami, Suman Nandy, Tomás R. Calmeiro, -1

机译：接触带电机制驱动的聚合物膜应力感应机电写入阅读
7. The comparison of gamma-radiation and electrical stress influences on oxide and interface defects in power VDMOSFET [O] . Đorić-Veljković Snežana M., Manić Ivica Đ., Davidović Vojkan S., 2013

机译：伽马辐射和电应力的比较影响功率VDmOsFET中的氧化物和界面缺陷
8. Accelerated Aging with Electrical Overstress and Prognostics for Power MOSFETs [R] . Saha, S., Celaya, J. R., Vashchenko, V., 2011

机译：具有电过载和功率mOsFET预测的加速老化

Radiation hardening of power MOSFETs using electrical stress

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