Measurement of plano-convex SC quartz blanks using lateral field excitation

摘要

The author addresses precision measurements of quartz crystal blanks before the electrodes are applied, which is advantageous in the production of crystal units excited by a lateral field. He discusses the use of a flat, lateral field jig. The precision is further enhanced by chemical polishing, which preserves the flatness and orientation of the lapped or ground quartz plates. The same jig can be used to identify unwanted or satellite resonant modes.