首页> 外文会议>Asia and South Pacific Design Automation Conference >TCI Tester: Tester for Through Chip Interface
【24h】

TCI Tester: Tester for Through Chip Interface

机译:TCI测试仪:通过芯片接口的测试仪

获取原文

摘要

TCI [1] is an inductive coupling wireless chip-to-chip interface. For forming a link with TCI, the transmitter coils are placed just above receivers’ ones, and data are transferred between them through the magnetic field. Each TCI channel needs two inductors, one for a high-speed clock signal (1-8GHz) and the other for the data directly transfer digital data synchronized with the clock signal without any modulation. TCI has the following advantages. First, the inductor consists of common wires in the CMOS process technology without the particular process technology, unlike the TSV. Also, ESD (Electro Static Discharge) protection device is unnecessary, since TCI is electrically contact-less.
机译:TCI [1]是一种电感耦合无线芯片到芯片接口。为了形成与TCI的连杆,发射器线圈放置在接收器上方,并且数据通过磁场在它们之间传送。每个TCI通道都需要两个电感器,一个用于高速时钟信号(1-8GHz),另一个电感器,另一个电感器直接与时钟信号同步的数字数据,而无需任何调制。 TCI具有以下优势。首先,与TSV不同,电感器由CMOS工艺技术中的CMOS工艺技术中的公共导线组成。而且,不需要ESD(电静电放电)保护装置,因为TCI较少电接触。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号