Auger electron spectroscopy [AES) has been developed to be one of the most flexible techniques for the chemical analysis of solid surfaces. This technique is most widely used within the field of materials technology for microelectronic purposes. However, in this paper we discuss the use of AES in conjunction with ion sputtering for the analysis of surfaces and surface layers pertinent to the tinplate industry. Chemical depth profiles of normal tinplate and tinplate with wood grain and black staining are presented.
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