Intellectual property in holographic interferometry

摘要

This paper presents an overview of patents and patent applications on holographic interferometry, and highlights the possibilities offered by patent searching and analysis. Thousands of patent documents relevant to holographic interferometry were uncovered by the study. The search was performed in the following databases: U.S. Patent Office, European Patent Office, Japanese Patent Office and Korean Patent Office for the time frame from 1971 through May 2006. The patent analysis unveils trends in patent temporal distribution, patent families formation, significant technological coverage within the market of system that employ holographic interferometry and other interesting insights.