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Calibration procedure for a quadrature meter of microwave path parameters

机译:微波路径参数正交仪表的校准过程

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The procedure for calibrating the device for automatic measurement of complex parameters and the power level of the microwave path is proposed. The procedure involves the determination of constants included in the system of measuring equations using exemplary impedance measures: movable short-circuited load; non-reflective load; load with known parameters. The calibration procedure can be carried out using three reference standards. The issue of optimization of the procedure from the point of view of minimizing the error caused by the residuals of the equations due to the error in measuring the quadrature components at the outputs of the quadrature detectors is considered. This is achieved by applying an additional reference standard and increasing the number of equations in the calibration system. A system of calibration nonlinear equations is obtained, the solution of which is carried out using an iterative procedure that provides a minimum of the mean square error.
机译:提出了用于校准用于自动测量复杂参数的装置和微波路径的功率电平。该方法涉及使用示例性阻抗措施测定测量方程系统中包括的常数:可移动的短路负载;非反光载荷;用已知参数负载。校准程序可以使用三个参考标准进行。考虑了由于在测量正交检测器的输出输出的误差时,从最小化由等式的残差引起的误差来优化过程的问题。这是通过应用附加参考标准来实现并增加校准系统中的等式数。获得校准非线性方程系统,其解决方案使用迭代过程来执行,该迭代过程提供最小的平均方误差。

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