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A Novel Traveling Wave Based Fault Location Algorithm for Teed-Circuits

机译:一种新型旅行波的TEED电路故障定位算法

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摘要

Based on the traveling wave fault location principle, the traveling wave fault location method of Teed circuit is studied, and the idea of comprehensively using the three-terminal measurement data of Teed-circuit for fault location is proposed, and a new criterion for fault branch identification and a new method for fault location are proposed accordingly. The branch identification criterion considers the influence of the actual fault location error factors on the branch misjudgment to ensure the validity of the branch identification; and the proposed fault location method makes full use of the three-terminal measurement data of Teed-circuit. Meanwhile, the influence caused by the uncertainty of wave velocity on the fault location result is eliminated in the fault location expression, and the fault location error caused by the line sags is eliminated to a certain extent. The ATP/EMTP simulation results show that the method proposed in this paper can accurately identify fault branches and locate fault points on Teed-circuit.
机译:基于该行波故障测距原理,开球电路的行波故障定位方法进行了研究,并提出了综合运用开球电路故障定位的三端测量数据的想法,并进行故障分支新标准相应地提出了识别和用于故障定位的新方法。分支识别标准考虑了实际故障定位误差因子对分支误解的影响,以确保分支识别的有效性;所提出的故障定位方法充分利用了三端电路的三端测量数据。同时,在故障位置表达式中消除了故障位置结果上的波速上的不确定度造成的影响,并且在一定程度上消除了由线落凹陷引起的故障定位误差。 ATP / EMTP仿真结果表明,本文提出的方法可以准确地识别故障分支并定位在TEED-LIFIC上的故障点。

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