An improved sine wave fitting procedure for characterizing dataacquisition channels

摘要

This paper presents a new sine wave fitting procedure forcharacterizing data acquisition channels and analog-to-digitalconverters. It overcomes most of the problems encountered with theclassical 3 or 4 parameter sine wave fitting procedure described in theIEEE Standard 1057. The stochastic properties of the new procedure arethoroughly analyzed. Its performance is illustrated by simulations andmeasurements with a high frequency sampling scope