A direct technique for determining complex permittivity ofdielectric material in a measurement cavity

摘要

In this paper, a direct technique for determining complexpermittivity of dielectric material in a cylindrical measurement cavityis presented. The method is based on a recently proposed enhancedspectral domain approach. In this analysis, a electromagnetic modelrelated to a composite cylindrical cavity is derived. Based on thismodel, the two fundamental problems (the direct and inverse problems)for cavity measurement systems are discussed in detail. A number ofnumerical examples are given to verify the proposed technique. Theeffect of structural parameters of the cavity on measurement accuracy isstudied