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A half inch size CCD image sensor overlaid with a hydrogenated amorphous silicon

机译:半英寸尺寸的CCD图像传感器,上面覆盖有氢化非晶硅

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A half inch size CCD image sensor overlaid with a hydrogenated amorphous silicon (a-Si:H) as a photodetector has been designed and fabricated. The array consists of 506(V) × 404 (H) picture elements and the imaging area is 4.8(V)mm × 6.4(H)mm By employing the glow-discharged a-Si:H film for photoconductive film, high sensitivity of 0.014µA/x with IR filter (3200°K) and high S/N ratio more than 71dB for the fixed-pattern-noise was obtained. The S/N ratio of random noise is about 68dB. Smearing signal ratio is suppressed to 5% for incident light intensity of 5000 times of the saturation exposure. The blooming and highlight lag are completely suppressed by using CCD with vertical overflow drain (VOFD).
机译:已经设计和制造了半英寸尺寸的CCD图像传感器,上面覆盖有氢化非晶硅(a-Si:H)作为光电探测器。该阵列由506(V)×404(H)个像素组成,成像区域为4.8(V)mm×6.4(H)mm。通过将辉光放电的a-Si:H膜用作光电导膜,可实现高感光度。使用IR滤镜(3200°K)可获得0.014µA / x的噪声,并且固定模式噪声的S / N比大于71dB。随机噪声的信噪比约为68dB。对于饱和曝光的5000倍的入射光强度,将拖影信号比率抑制为5%。通过使用带有垂直溢出漏极(VOFD)的CCD,可以完全抑制起霜和高光延迟。

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