首页> 外文会议>Electromagnetic Compatibility, 1995. Symposium Record. 1995 IEEE International Symposium on >Using statistics to reduce the uncertainty in system levelsusceptibility testing
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Using statistics to reduce the uncertainty in system levelsusceptibility testing

机译:使用统计数据来减少系统级别的不确定性药敏试验

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Products containing electronics must generally be tested forelectromagnetic susceptibility, as part of their EMC certificationprocess, at the end of their development cycle to ensure that the testis representative of any future use of the product. However, the earlierthat the product as a whole, or the electronic systems that might formpart of the product, can be tested for susceptibility, the more benefitcan be gained from such a procedure. Both a saving in time and cost canbe achieved in the product development process. This paper describes astatistical technique which has been developed for use in the automotiveindustry with a bulk current injection (BCI) test. It has been designedto help overcome the uncertainties in correlating results from such asystem-level bench test with results from the final vehicle-levelsign-off test carried out in a full-threat field within a semi-anechoicEMC chamber. The technique uses a probability distribution function withthe mean transfer function and its standard deviation to estimate therisk of the test system, once installed in a vehicle, malfunctioningwhen that vehicle is exposed to radiation of a particular field strengthand frequency. The effect of vehicle body dimensions on these riskfigures has been examined and a simple mathematical model usingstatistical input data has been produced which shows some agreement withthe measured data
机译:包含电子产品的产品通常必须经过测试 电磁敏感性,作为其EMC认证的一部分 过程,在其开发周期结束时确保测试 代表该产品将来的任何使用。但是,较早的 整个产品或可能形成的电子系统 产品的一部分,可以进行药敏试验,更多的好处 可以从这样的过程中获得。既节省时间又节省成本 在产品开发过程中实现。本文介绍了一个 开发用于汽车的统计技术 工业用大电流注入(BCI)测试。它已经被设计 以帮助克服这种不确定性相关结果的不确定性 系统级别的基准测试,并包含最终车辆级别的结果 在半消声的全威胁场中进行签核测试 EMC室。该技术将概率分布函数与 均值传递函数及其标准偏差来估计 测试系统的风险,一旦安装在车辆中,就会发生故障 当该车辆暴露于特定场强的辐射下时 和频率。车身尺寸对这些风险的影响 对数字进行了检查,并使用了一个简单的数学模型 统计输入数据已经产生,表明与 实测数据

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