首页> 外文会议>IEEE Symposium on VLSI Technology >RX-PUF: Low Power, Dense, Reliable, and Resilient Physically Unclonable Functions Based on Analog Passive RRAM Crossbar Arrays
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RX-PUF: Low Power, Dense, Reliable, and Resilient Physically Unclonable Functions Based on Analog Passive RRAM Crossbar Arrays

机译:RX-PUF:基于模拟无源RRAM交叉开关阵列的低功耗,密集,可靠和弹性的物理不可克隆功能

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We propose a novel architecture ("RX-PUF") for physically unclonable functions (PUF) based on analog RRAM crossbar array circuits. RX-PUF takes advantage of unique RRAM properties, such as I-V nonlinearity, and its device-to-device (d2d) variations and tunability. As a proof of concept, we have prototyped a 600 kb challenge response pair (CRP) PUF using 250 nm half-pitch (F) 20×20 crossbar arrays with passively integrated devices. The RX-PUF prototype features excellent physical characteristics, e.g. ~1600 F2/bit density and up to 41 fJ/bit energy efficiency. Its functional performance, improved by utilizing hidden input, is also very promising. The measured bit error rate (BER) was 0.7% at RT and ≤ 5.3% at 100°C, even without using any error correction methods. The measured responses showed near-ideal uniformity (50.04%) and inter-HD (50.12%) and passed all relevant NIST randomness tests. The preliminary results showed also very high resilience of RX-PUF against machine learning (ML) attacks.
机译:我们为基于模拟RRAM交叉开关阵列电路的物理不可克隆功能(PUF)提出了一种新颖的体系结构(“ RX-PUF”)。 RX-PUF利用独特的RRAM特性,例如I-V非线性,其器件间差异(d2d)和可调性。作为概念验证,我们使用带被动集成设备的250 nm半间距(F)20×20交叉开关阵列为600 kb挑战响应对(CRP)PUF制作了原型。 RX-PUF原型具有出色的物理特性,例如〜1600华氏度 2 / bit密度和高达41 fJ / bit的能量效率。通过利用隐藏的输入来改善其功能性能也是非常有前途的。即使在不使用任何纠错方法的情况下,测得的误码率(BER)在室温下为0.7%,在100°C下为≤5.3%。测得的响应显示出接近理想的均匀性(50.04%)和HD间的一致性(50.12%),并通过了所有相关的NIST随机性测试。初步结果表明,RX-PUF还具有很高的抵御机器学习(ML)攻击的能力。

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