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Modeling Analysis of Redundancy Based Fault Tolerance for Permanent Faults in Chip Multiprocessor Cache

机译:芯片多处理器高速缓存中永久性故障的冗余容错建模与分析

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With increased number of cores in Multicore Chips, power consumption raises. Voltage scaling is applied largely but it causes cell failure in cache. For that, various techniques for fault tolerance in cache have been introduced. Among these techniques, the redundancy based technique is the most effective one but no analysis has yet been done to assess its performance. This work attempts to propose and evaluate the parameters like Expected Miss Ratio for Multicore (EMRMC) and Expected Latency in Multicore (ELMC), as the function of Probability of Cell Failure (Pfail) for redundancy based technique. It is found that both (EMRMC) and (ELMC) decrease with increased number of cores. The lower bound of Pfail i.e. 1e-4, up to which both (EMRMC) and (ELMC) in all architectures remain same. Above that both (EMRMC) and (ELMC) increases except for octacore. The (EMRMC) for octacore starts increasing above Pfail of 5E-4 and converges with others for high Pfail like 0.005. On the other hand, the (ELMC) for octacore is hardly affected up to high Pfail like 0.001 and above that though it increases but remains lower than others. Performance gain of up to 34.63% for (EMRMC) and 45.67% for (ELMC) is observed with increased number of cores.
机译:随着多核芯片中的核数量增加,功耗升高。电压缩放很大程度上应用,但它会导致缓存中的细胞失败。为此,已经介绍了缓存中容错的各种技术。在这些技术中,基于冗余的技术是最有效的技术,但尚未进行分析以评估其性能。这项工作试图提出和评估多核(EMR MC )的预期错误比例,以及多核(EL MC )中的预期延迟,作为单元的概率基于冗余技术的故障(P 失败)。发现(EMR MC )和(EL MC )随着核心数量的增加而减少。 P 失败 IE 1E-4的下限,上面所有架构中的(EMR MC )和(EL MC )都保持不变。以上两者(EMR mc )和(EL mc )除了Octacore之外的增加。 Octacore的(EMR mc )开始增加5e-4的P 失败,并与其他用于高p 失败相同的其他。另一方面,Octacore的(EL MC )几乎不会受到高p 失败,如0.001及更高版本,但它增加但仍然低于其他物质。 (EMR MC )和45.67 \%的性能增益高达34.63 \%(EL MC ),随着核心数量的增加。

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