"Function Tokens" and "NOP Fills" are two methods proposed by various authors to deal with instruction pointer corruption in microcontrollers, especially in the presence of high electromagnetic interference levels. An empirical analysis to assess and compare these two techniques is presented in this paper. Two main conclusions are drawn: [1] NOP Fills are a powerful technique for improving the reliability of embedded applications in the presence of EMI, and [2] the use of function tokens can lead to a reduction in overall system reliability.
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