首页> 外文会议>Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on >Criteria for absorber's reflectivity lined in semi-anechoicchambers using ray-tracing technique
【24h】

Criteria for absorber's reflectivity lined in semi-anechoicchambers using ray-tracing technique

机译:半消声衬里的吸收体反射率准则光线追踪技术的暗室

获取原文

摘要

Semi-anechoic chambers are used for EMC measurement from 30 MHz to1000 MHz. Criteria for absorber's reflectivity lined in semi-anechoicchambers are discussed based on a ray-tracing analysis. The absorber'sreflectivity of -15 dB and -20 dB for normal incidence is sufficient tosatisfy a standard in 3 m and 10 m measurement methods, respectively.The dimensions of the chamber can be reduced to L=8 m, W=6 m and H=5 mfor the 3 m method and to L=18 m, W=13 m and H=7 m for the 10 m method
机译:半消声室用于30 MHz至30 MHz的EMC测量 1000 MHz。半消声衬里的吸收体反射率准则 基于射线追踪分析讨论了暗室。吸收器的 垂直入射的-15 dB和-20 dB的反射率足以 分别满足3 m和10 m测量方法的标准。 腔室的尺寸可以减小为L = 8 m,W = 6 m和H = 5 m 对于3 m方法,对于L = 18 m,对于10 m方法,W = 13 m,并且H = 7 m

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号