A new approach to the extraction of phase data from interferometricfringe patterns

摘要

It is shown that the single phase step technique has some definiteadvantages over those using more phase steps. It gives a computationallysimple solution for 0(x,y) performed at greatly increased speedutilising an 8-bit look-up table. Only one phase step is required whichpractically eliminates environmental drift errors, which is especiallyimportant at the data acquisition stage. Because it needs only two phaseshifted interferometric fringe patterns, the image memory required tostore the data is reduced by a factor of 3. The reduced environmentaland error sensitivity is ideal for fringe processing in industrialapplications, this being enhanced by the use of pulsed laserillumination