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Tracking a magnetic nanoparticle in 3-D with a magnetic force microscope

机译:用磁力显微镜跟踪3-D中的磁性纳米粒子

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In this paper we introduce a scheme for tracking a magnetic nanoparticle in 3-D with the tip of a magnetic force microscope. The stray magnetic field of the magnetic particle induces a shift in the phase of oscillation of the tip of the MFM. We present a feedback control law which translates the measurement of this phase shift into actuator commands to the MFM and prove that the trajectory of the tip converges to a neighborhood of the magnetic particle. This geometric control law depends only on the derivative of the potential along the trajectory of the tip and in particular does not rely on any detailed prior knowledge about the nanoparticle. The results of simulation studies are shown to illustrate the algorithm.
机译:在本文中,我们介绍了一种利用磁力显微镜的尖端跟踪3-D磁性纳米粒子的方案。磁性粒子的杂散磁场会引起MFM尖端振荡相位的偏移。我们提出了一个反馈控制定律,该定律将该相移的测量值转换为对MFM的执行器命令,并证明了尖端的轨迹会聚到磁性粒子的附近。该几何控制定律仅取决于沿着尖端的轨迹的电势的导数,并且特别地不依赖于关于纳米粒子的任何详细的先验知识。仿真研究的结果说明了该算法。

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