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Research on Noise Testing and Reduction of Low Illumination Imaging module

机译:低照度成像模块的噪声测试与降噪研究

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摘要

As the rapid development of back-illuminated CMOS (BI-CMOS) image sensor technology in recent years, itsapplication prospect in the field of Low-Light-Level (LLL) night vision has been widely concerned. Therefore, LLLimaging module was developed based on BICMOS, whose 3-D noise data was obtained under different illuminationconditions. The test results show that, the signal-to-noise ratio (SNR) of imaging module becomes worse with thedecreasing of illumination. According to the judgement of noise, the noise power of the image in low illumination ismainly Gaussian distribution. And the image processed by spatial filtering, which efficiently reducing the imaging noiseand improving the imaging quality.
机译:随着近年来背照式CMOS(BI-CMOS)图像传感器技术的飞速发展,其 在微光夜视领域的应用前景受到广泛关注。因此,LLL 基于BICMOS的成像模块,其3-D噪声数据是在不同照明条件下获得的 情况。测试结果表明,成像模块的信噪比(SNR)随着 减少照明。根据噪声的判断,低照度下图像的噪声功率为 主要是高斯分布。并对图像进行空间滤波处理,从而有效降低成像噪声 并提高成像质量。

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