Dielectric constant and loss tangent measurement using a striplinefixture

摘要

An approach to dielectric material characterization with a vectornetwork analyzer is presented. As the characteristic impedance (Z₀) of a stripline transmission line can be accurately determined bymeasuring the two-port scattering parameters in the frequency range ofinterest, the dielectric constant of the insulation material thatconsists of part of the stripline configuration is then obtained byrelationship to the characteristic impedance. The dielectric loss (orloss tangent) can be determined by measuring the return loss and theinsertion loss of the stripline. The validity of the technique isdemonstrated for well-characterized dielectric materials such asTeflon-based and other composite laminates. The technique is thenapplied to IC molding compounds as processed