首页> 外文会议>Electrical Insulation and Dielectric Phenomena, 1996. IEEE 1996 Annual Report of the Conference on >The application of scanning acoustic microscopy to dielectricpolymer composite material study
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The application of scanning acoustic microscopy to dielectricpolymer composite material study

机译:扫描声显微镜在电介质中的应用高分子复合材料研究

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Acoustic microscopy is an effective method for visualization andquantitative analysis of physico-mechanical properties andmicrostructure of dielectric polymer blends and polymer composites. Itallows one to use this method for investigating a wide variety of opaquematerials and obtaining information about their inner structure as wellas for optically transparent materials in which the contrast betweendifferent structures is practically absent. The methods of acousticmicroscopy turns out to be very sensitive to any kind of inhomogenetiesas well as various bulk defects: microcracks, pours, adhesiondisturbance, exfoliation, inclusions, deviations from the giventhickness off the layer in multilayered system and coating,technological deviations of sizes, orientation and grain distribution.In this work, the authors present experimental results investigation oftwo groups of objects. First is, polyethylene-polystyrene mixture filmsproduced by different methods, where acoustic images clearly reveal theinternal distribution of phases for each technological process. Thesecond group is a multilayer dielectric structure, formed by differentkinds of polymer, such as high density polyethylene, polyamide orethylene vinyl alcohol, etc. In this case methods were used fornondestructive measurement of the thickness of multilayer polymercomposite and adhesive layer and defect inspection
机译:声学显微镜是一种有效的可视化方法, 物理力学性能的定量分析 介电聚合物共混物和聚合物复合材料的微观结构。它 允许人们使用这种方法来调查各种各样的不透明 材料并获得有关其内部结构的信息 至于光学透明的材料,其之间的对比度 实际上没有不同的结构。声学方法 显微镜对任何一种不均匀性都非常敏感 以及各种体积缺陷:微裂纹,倾倒,粘附 干扰,剥落,夹杂物,与给定的偏差 多层体系和涂层中涂层的厚度, 尺寸,方向和晶粒分布的技术偏差。 在这项工作中,作者提出了实验结果的调查 两组对象。首先是聚乙烯-聚苯乙烯混合物薄膜 通过不同的方法产生的声音图像清楚地显示了 每个技术过程的阶段内部分配。这 第二组是多层介电结构,由不同的 各种聚合物,例如高密度聚乙烯,聚酰胺或 乙烯乙烯醇等。在这种情况下,方法用于 多层聚合物厚度的无损测量 复合材料和胶粘剂层及缺陷检查

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