首页> 外文会议>Electrical Insulation and Dielectric Phenomena, 1994. IEEE 1994 Annual Report., Conference on >Flashover triggered by charge detrapping at dielectric-vacuuminterface
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Flashover triggered by charge detrapping at dielectric-vacuuminterface

机译:介电真空中电荷的去俘获触发了闪络接口

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The first part of the work will show that recent progress in theunderstanding of the flashover mechanism allows: (1) to explaintechnical observations made during breakdown: time lag, particleemissions, cathode and anode initiated phenomena, mechanical fracture,etc.; (2) to know what material parameters are deterministic of thebreakdown strength: static permittivity, trap energy, variation of theinternal energy as function of the polarization, energy density requiredfor damaging the sample, etc.; (3) to explain the importance oftechnologies on the breakdown strength: insulator technology (machining,surface treatments), vacuum device technology (design of the triplejunction, soldering, sealing, conditioning, etc.). In the second part,the attention will be focused on the secondary electron emission. Theyield depends on the nature of the material (crystal structure, defectdistribution) and, in most cases, electron irradiation produces thetrapping of both types of charges. Positive charges are trapped in theoutermost layers and negative charges are trapped in the deepest layers.Therefore, the yield is dependent on the space charge field. Moreover,secondary electrons can be produced during electron-solid interactionsand during dielectric processes. In the third part, the method that hasbeen developed for measuring the permittivity and the detrapping spacecharge field will be recalled. These two parameters are linked with thesecondary electron yield
机译:工作的第一部分将显示 对闪络机制的理解允许:(1)解释 故障期间的技术观察:时滞,颗粒 发射,阴极和阳极引发的现象,机械断裂, 等等。; (2)知道哪些材料参数是确定的 击穿强度:静电电容率,陷阱能量,的变化 内部能量作为极化的函数,需要能量密度 损坏样品等; (3)说明重要性 击穿强度技术:绝缘子技术(机械加工, 表面处理),真空装置技术(三重设计) 连接,焊接,密封,调节等)。在第二部分中 注意力将集中在二次电子发射上。这 良率取决于材料的性质(晶体结构,缺陷 分布),并且在大多数情况下,电子辐照会产生 诱捕两种类型的费用。正电荷被困在 最外层和负电荷被困在最深的层中。 因此,产量取决于空间电荷场。而且, 电子-固体相互作用过程中会产生二次电子 以及介电过程中。第三部分,具有 专为测量介电常数和脱圈空间而开发 收费字段将被召回。这两个参数与 二次电子产率

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