Thermal aging effects on the electrical properties of film andceramic capacitors

摘要

Experiments are carried out to evaluate film and ceramiccapacitors for potential use in high temperature applications. Thecapacitors are characterized in terms of their capacitance stability anddielectric loss in the frequency range of 50 Hz to 100 kHz attemperatures of 20° C to 200° C. DC leakage current measurementsare also obtained as a function of temperature. The effects of thermalstressing, in air and without electrical bias, on the properties of thecapacitors are determined as a function of thermal aging up to 12 weeks.The results indicated that short-term aging has minimal influence on thedielectric properties of both the teflon and ceramic type capacitors