Off-focal-plane time delay and integration (OTDI) using charge coupled devices

摘要

The signal-to-noise ratios (SNR) of mechanically scanned imaging sensors can be improved by scanning the same image point over N detectors and adding the resulting detector signals in phase, a process referred to as time delay and integration (TDI). In principle, this allows the signal level associated with a single resolution element to be increased by a factor N, while SNR increases by √N.