首页> 外文会议>Electromagnetic Compatibility Symposium Record, 1968 IEEE >Characteristics of ion beams produced in a plasma focus device
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Characteristics of ion beams produced in a plasma focus device

机译:等离子聚焦装置中产生的离子束的特性

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Characteristics of the ion beams produced in a plasma focus device were studied. In the experiment, a Mather type plasma focus device was used and it was pre-filled with 2.3 Torr H2. The plasma focus device capacitor bank of 43.2 µF was charged to 30 kV to get a peak current of 350 kA. Ion spices and their energy spectrums were evaluated using a Thomson parabola spectrometer, and the particle pinhole image was obtained with an aluminum filtered particle pinhole camera. While, the ion current density was measured with a biased ion corrector. The proton beam energy was distributed from 0.15 MeV to 2 MeV. On the other hand, we found singly and multiply ionized ions of C, N,. The particle pinhole image of the proton beam, which has energy more than 1MeV, was spot type. The ion current density of 1200A/cm2 was obtained. The peak power brightness for the proton beams was 18 GW / cm2 / Sr /keV.
机译:研究了在等离子体聚焦装置中产生的离子束的特性。在实验中,使用了马瑟(Mather)型等离子聚焦装置,并预先填充了2.3托H2。将等离子聚焦设备电容器组43.2 µF充电至30 kV,以获得350 kA的峰值电流。使用Thomson抛物线光谱仪评估离子香料及其能谱,并使用铝过滤颗粒针孔照相机获得颗粒针孔图像。同时,用偏置离子校正器测量离子电流密度。质子束能量从0.15 MeV分布到2 MeV。另一方面,我们发现C,N,和I的电离离子个数繁多。能量大于1MeV的质子束的粒子针孔图像为点型。得到的离子电流密度为1200A / cm 2 。质子束的峰值功率亮度为18 GW / cm 2 / Sr / keV。

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